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Advantest wins new customer with installation of V93000 semiconductor test system at Shanghai Haier IC in China

Press release [Tuesday 17 March 2015]

Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has received its first order from Shanghai Haier IC, an IC design company in China that develops microcontrollers, embedded memories and radio-frequency (RF) connectivity semiconductors, for a V93000 Smart Scale tester in the cost-efficient Dragon configuration with a highly compact A-Class test head, Advantest's smallest.

Shanghai Haier IC will use the tester in embedded Flash, RF microcontroller (RF-MCU) and digital probe testing for all of the products on its technology roadmap, most of which rely on embedded Flash memory for applications such as smart grid, smart home, the Internet of Things (IoT), industrial controls and consumer electronics.

"We were looking for a universal platform that could efficiently test our full range of devices while achieving the lowest cost of test and reducing our time to market," said Wang Zhenyu, Operation Director of Shanghai Haier IC. "Advantest's V93000 system has the scalability and flexibility to meet our performance demands while also supporting us in simplifying our supply chain."

"For Smart Meter device testing, our V93000 offers higher multi-site efficiency, faster test times and a lower cost of test than the testers Shanghai Haier IC had used in the past," said Hans-Juergen Wagner, senior vice president of the SoC Business Group at Advantest Corporation. "At the same time, the scalability of the V93000 platform allows them to address the broad test challenges of the IoT market. It's this type of industry-leading performance that has enabled the V93000 to reach record sales in the past year, making it the world's most popular semiconductor test platform."

The modular V93000 platform can be custom-configured to ensure maximum system loading and provide the highest return on investment (ROI) for each user. It features a universal per-pin architecture for highly efficient multi-site testing of digital I/O protocols, non-volatile memories and A/D and D/A converters, making a dedicated analog card obsolete. In addition, the V93000 tester's capabilities can be extended with an entry Port Scale RF configuration, which enables a 40 percent cost-of-test advantage over PXI-based RF solutions.

DIGITIMES' editorial team was not involved in the creation or production of this content. Companies looking to contribute commercial news or press releases are welcome to contact us.

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