TI high-temperature H.E.A.T. evaluation module speeds safe testing of electronics for harsh and hot environments
Company [Monday 4 July 2011]
TI introduced the H.E.A.T. (harsh environment acquisition terminal) evaluation module (EVM), which includes a complete set of TI signal chain components qualified for extreme temperature operation from -55ºC to 210ºC. The H.E.A.T. EVM is test-oven ready and qualified to operate up to 200 hours at oven temperatures of up to 200ºC. The H.E.A.T. EVM complements TI's full portfolio of analog and embedded processing products for high-temperature, high-reliability environments.
Category: Product launch | Posted: Jul 4, 11:50 | More info