62 news items tagged Advantest
Advantest announces newest handler for testing advanced memory ICs
Thursday 11 December 2014Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has introduced its new M6245 test handler, offering industry-leading productivity with minimal...
Advantest introduces newest parametric measurement module to extend SoC testing capabilities of T2000 platform
Wednesday 26 November 2014Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has launched a new multi-purpose parametric measurement unit (PMU) module, the T2000 PMU32E,...
Advantest introduces leading-edge tester for display driver semiconductors used in high-resolution LCD panels
Tuesday 4 November 2014
Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has launched its new T6391 system for testing next-generation display driver ICs (DDIs)...
Advantest launches TS9000 system for semiconductor packaging inspection
Tuesday 7 October 2014Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) announced that a new mold thickness metrology system, the TS9000, for measuring the thickness...
Advantest expects modest growth in ATE demand through 2014
Friday 4 October 2013The global market for automated test equipment (ATE) is expected to see modest growth in 2013 and 2014, but will likely start to cycle down in 2015, according to Advantest Taiwan...
Display and DRAM industries ready to rebound, says Advantest Taiwan president
Thursday 17 January 2013The display and DRAM industries have both hit bottom, and are likely to stage a rebound in 2013, according to Advantest Taiwan president CH Wu.
Advantest integrated test cell adopted by Marvell
Wednesday 9 January 2013Advantest has installed the first evaluation unit of its new test cell at Marvell, integrating its T2000 EPP (enhanced performance package) and M4841 dynamic test handler, according...
Advantest expects 28nm-based ICs to drive business growth in 2013-2014
Thursday 15 November 2012The rapid transitioning of application processor manufacturing process to a 28nm node will continue to stir up demand for IC testing equipment, which will help drive up growth of...
Advantest introduces T2000 IMS testing equipment in Taiwan
Wednesday 14 November 2012Advantest, a Japan-based provider of IC testing total solutions, on November 14 introduced the T2000 IMS (integrated massive parallel test solution), designed to achieve lowest-cost...
ASML unseats Applied in semiconductor equipment ranking, says VLSI
Friday 16 March 2012VLSI Research has released its 2011 top semiconductor equipment suppliers ranking. During the year, Advantest closed its acquisition of Verigy in July and Applied Materials acquired...
Intel, Qualcomm, Amkor, Advantest join up to improve IC testing efficiency
Wednesday 29 October 2008Major players from the semiconductor and test community, including Advantest, Amkor, Infineon, Intel, LTX-Credence, Qualcomm, Roos Instruments, Teradyne, and Verigy, announced that...
DRAM tester vendors ready for DDR3, but no crossover in sight yet
Tuesday 10 June 2008Despite leading memory tester vendors Advantest and Verigy both having rolled out solutions for DDR3 testing, projection of a meaningful crossover between DDR3 and DDR2 has yet to...
- Advantest ships 800th V93000 Port Scale RF tester to JCET (Jun 14) - Company release
- Verigy ships 2,500th SoC test platform (September 1) - Company release
- LTX-Credence ends Verigy merger after Advantest takeover bid (Mar 28) - Bloomberg
- Verigy says Advantest offer 'superior' (Mar 21) - AP (via Business Week)
- Advantest may pay $729 million in unsolicited bid for Singapore's Verigy (Dec 7) - Bloomberg
- Will Teradyne enter DRAM test market? - EE Times
