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UMC announces advancement in its high-k/metal-gate process solution

Press release, November 27; Michael McManus, DIGITIMES Asia Thursday 27 November 2008 0

United Microelectronics Corporation (UMC) recently announced the validation of its high-k/metal-gate (HK/MG) technology with process through 45nm SRAM product yield. This achievement is a first key-step in demonstrating technology performance and process...

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