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STAr Technologies releases new test software for advanced wafer-level reliability qualification

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STAr Technologies, a provider of semiconductor test solutions, releases a new Sagittarius-WLR integrated platform for advanced Wafer-Level Reliability (WLR) tests. Sagittarius-WLR is developed to address new device reliability qualification needs for advanced nanometer node technologies. More than 30 test algorithms are newly developed or revised to meet advanced reliability qualifications including ultra-fast NBTI/PBTI, HCI, GOI/TDDB, isothermal electromigration, etc. Sagittarius-WLR is one of the most comprehensive all-encompassing software for fast, predictive, and qualified solutions for advanced technology nodes semiconductor devices with reliability qualifications.

The Sagittarius-WLR covers most of the critical reliability test requirements and features parallel multi-device and multi-tester operations to reduce qualification time. With dynamic parallel execution mode, users can concurrently run multiple devices to reduce qualification time by stressing and testing devices in parallel. At the same time, the multi-tester operation mode allows independent and a maximum of 32 virtual testers running tests in parallel under one hardware configuration. This flexibility will enable all kinds of test splits and dynamic test selection with parallel automated test operations.

Furthermore, Sagittarius-WLR is designed with functions that allow users to have efficient reliability with real-time display of Pass/Fail judgment and test data. This test system can further be applied for electrical process-control monitoring (PCM), reliability monitoring, and reliability qualification. The system data will simultaneously be stored in the file management system as raw data in office CSV or any user-defined format locally or in the cloud for online data analysis with software tools provided. Hundreds of copies of Sagittarius-WLR have been installed and all can be upgraded with the new capabilities and can successfully improve reliability qualification efficiency and increases throughput.

Yu-Ming Chien, President of STAr Technologies test business group, comments on this high-value test system, "STAr is devoted to the development of semiconductor reliability test for decades and continues to provide solutions that enhance measurement efficiency and accuracy. Sagittarius-WLR is the best-integrated test platform and indeed improves reliability qualification efficiency and proven track records with installations covering all the top foundries."