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ICC selects Agilent’s automated test platforms to fulfill rising test demand of IC design houses in China

Press release; Richard So, DIGITIMES Asia Friday 8 August 2003 0

Agilent Technologies on August 7 announced that the Shanghai Research Center for Integrated Circuit Design (ICC) has selected multiple Agilent automated test platforms, including the Agilent 93000 SoC series and the Versatest series for memory testing...

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