3D NAND die with M.2 SSD
Intel and Micron have jointly announced the availability of their 3D NAND technology. This...
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KLA-Tencor 2910 series optical inspection system and eDR-7100 e-beam review tool
KLA-Tencor has announced the new 2910 series optical wafer defect inspection platform with...
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KLA-Tencor Surfscan SP3
KLA-Tencor has announced a new generation in the Surfscan family of wafer defect and surface...
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KLA-Tencor Archer 300 LCM metrology system
KLA-Tencor has introduced the Archer 300 LCM Metrology system, which offers precision and...
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Applied iSYS
Applied Materials has unveiled what it claims is the industry's first fully-integrated abatement...
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Applied Materials Solar Technology Center in China
Applied Materials has opened an advanced solar research and demonstration facility in Xian,...
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KLA-Tencor 8900 inspection system
KLA-Tencor has extended its product offerings in the CMOS image sensor (CIS) market by announcing...
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